An improved correction method for charge transfer efficiency of XIS onboard Suzaku
Abstract
X-ray Imaging Spectrometer (XIS) onboard Suzaku is equipped with the Spaced-row Charge Injection (SCI) technique in order to suppress charge transfer inefficiency (CTI). The accuracy of the energy-scale has been getting worse. With the systematic analysis of the fiveyear data, we found that the accuracy deterioration is due to the unexpected behaviors of CTI: one is some discontinuous increases of CTI and the other is gradual time variation of its dependency on pulse heights of signal charges. By taking them into account, we upgraded the CTI correction method and achieved high accuracy of the energy scale both in the low and highenergy bands (<0.7% at ~1 keV and <0.1% at ~6 keV) over five years.
- Publication:
-
Suzaku 2011: Exploring the X-ray Universe: Suzaku and Beyond
- Pub Date:
- March 2012
- DOI:
- 10.1063/1.3696186
- Bibcode:
- 2012AIPC.1427..245S